Add peripheral stress test

This includes I2C and ADC. PECI test will be added in another CL.

BUG=chrome-os-partner:18598
TEST=Run on Spring
BRANCH=None

Change-Id: I7424dbf5d3cefda67cad9aaad60367d957c47529
Signed-off-by: Vic Yang <victoryang@chromium.org>
Reviewed-on: https://gerrit.chromium.org/gerrit/48614
Reviewed-by: Vincent Palatin <vpalatin@chromium.org>

3 files changed, 159 insertions, 0 deletions

diff --git a/test/build.mk b/test/build.mk
index 45d1d5b93d..3bbb239b91 100644
--- a/test/build.mk
+++ b/test/build.mk
@@ -8,6 +8,7 @@
 
 test-list=pingpong timer_calib timer_dos timer_jump mutex thermal
 test-list+=power_button kb_scan scancode typematic charging flash
+test-list+=stress
 #disable: powerdemo
 
 flash-y=flash.o
@@ -15,6 +16,7 @@ kb_scan-y=kb_scan.o
 mutex-y=mutex.o
 pingpong-y=pingpong.o
 powerdemo-y=powerdemo.o
+stress-y=stress.o
 timer_calib-y=timer_calib.o
 timer_dos-y=timer_dos.o
 utils-y=utils.o
diff --git a/test/stress.c b/test/stress.c
new file mode 100644
index 0000000000..5cff054347
--- /dev/null
+++ b/test/stress.c
@@ -0,0 +1,140 @@
+/* Copyright (c) 2013 The Chromium OS Authors. All rights reserved.
+ * Use of this source code is governed by a BSD-style license that can be
+ * found in the LICENSE file.
+ */
+
+/* Peripheral stress tests */
+
+#include "adc.h"
+#include "board.h"
+#include "console.h"
+#include "ec_commands.h"
+#include "i2c.h"
+#include "timer.h"
+#include "util.h"
+
+static int error_count;
+
+/*****************************************************************************/
+/* Test parameters */
+
+/* I2C test */
+#define I2C_TEST_ITERATION 2000
+
+struct i2c_test_param_t {
+	int width; /* 8 or 16 bits */
+	int port;
+	int addr;
+	int offset;
+	int data; /* Non-negative represents data to write. -1 to read. */
+} i2c_test_params[] = {
+#ifdef BOARD_spring
+	{8, 0, 0x60, 0x0, -1},
+	{8, 0, 0x60, 0x0, 0x40},
+	{8, 0, 0x4a, 0x1, -1},
+#endif
+	/* TODO(victoryang): Add parameters for other boards */
+};
+
+/* ADC test */
+#define ADC_TEST_ITERATION 2000
+
+/* TODO(victoryang): PECI test */
+
+/*****************************************************************************/
+/* Test utilities */
+
+/* Linear congruential pseudo random number generator*/
+static uint32_t prng(void)
+{
+	static uint32_t x = 1357;
+	x = 22695477 * x + 1;
+	return x;
+}
+
+/* period between 500us and 32ms */
+#define RAND_US() (((prng() % 64) + 1) * 500)
+
+static int stress(const char *name,
+		  int (*test_routine)(void),
+		  const int iteration)
+{
+	int i;
+
+	for (i = 0; i < iteration; ++i) {
+		if (i % 10 == 0) {
+			ccprintf("\r%s...%d/%d", name, i, iteration);
+			usleep(RAND_US());
+		}
+		if (test_routine() != EC_SUCCESS)
+			return EC_ERROR_UNKNOWN;
+	}
+
+	ccprintf("\r%s...%d/%d\n", name, iteration, iteration);
+	return EC_SUCCESS;
+}
+
+#define RUN_STRESS_TEST(n, r, iter) \
+	do { \
+		if (stress(n, r, iter) != EC_SUCCESS) { \
+			ccputs("Fail\n"); \
+			error_count++; \
+		} \
+	} while (0)
+
+/*****************************************************************************/
+/* Tests */
+#ifdef CONFIG_I2C
+static int test_i2c(void)
+{
+	int res = EC_ERROR_UNKNOWN;
+	int dummy_data;
+	struct i2c_test_param_t *param;
+	param = i2c_test_params + (prng() % (sizeof(i2c_test_params) /
+				   sizeof(struct i2c_test_param_t)));
+	if (param->width == 8 && param->data == -1)
+		res = i2c_read8(param->port, param->addr,
+				param->offset, &dummy_data);
+	else if (param->width == 8 && param->data >= 0)
+		res = i2c_write8(param->port, param->addr,
+				 param->offset, param->data);
+	else if (param->width == 16 && param->data == -1)
+		res = i2c_read16(param->port, param->addr,
+				 param->offset, &dummy_data);
+	else if (param->width == 16 && param->data >= 0)
+		res = i2c_write16(param->port, param->addr,
+				  param->offset, param->data);
+
+	return res;
+}
+#endif
+
+#ifdef CONFIG_ADC
+static int test_adc(void)
+{
+	int data[ADC_CH_COUNT];
+	return adc_read_all_channels(data);
+}
+#endif
+
+static int command_run_test(int argc, char **argv)
+{
+	error_count = 0;
+
+#ifdef CONFIG_I2C
+	RUN_STRESS_TEST("I2C Stress Test", test_i2c, I2C_TEST_ITERATION);
+#endif
+#ifdef CONFIG_ADC
+	RUN_STRESS_TEST("ADC Stress Test", test_adc, ADC_TEST_ITERATION);
+#endif
+
+	if (error_count) {
+		ccprintf("Failed %d tests!\n", error_count);
+		return EC_ERROR_UNKNOWN;
+	} else {
+		ccprintf("Pass!\n");
+		return EC_SUCCESS;
+	}
+}
+DECLARE_CONSOLE_COMMAND(runtest, command_run_test,
+			NULL, NULL, NULL);
diff --git a/test/stress.tasklist b/test/stress.tasklist
new file mode 100644
index 0000000000..26cfc53453
--- /dev/null
+++ b/test/stress.tasklist
@@ -0,0 +1,17 @@
+/* Copyright (c) 2013 The Chromium OS Authors. All rights reserved.
+ * Use of this source code is governed by a BSD-style license that can be
+ * found in the LICENSE file.
+ */
+
+/**
+ * List of enabled tasks in the priority order
+ *
+ * The first one has the lowest priority.
+ *
+ * For each task, use the macro TASK_TEST(n, r, d, s) where :
+ * 'n' in the name of the task
+ * 'r' in the main routine of the task
+ * 'd' in an opaque parameter passed to the routine at startup
+ * 's' is the stack size in bytes; must be a multiple of 8
+ */
+#define CONFIG_TEST_TASK_LIST  /* No test task */