diff options
author | Simon Glass <sjg@chromium.org> | 2012-10-10 09:47:00 -0700 |
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committer | Gerrit <chrome-bot@google.com> | 2012-10-31 17:21:00 -0700 |
commit | f3c88fa1ab60101f32f9117dced3afdc3f4c9393 (patch) | |
tree | b751fa8ac6ff6861b33a23a520c34cde1eced1cd /include/keyboard_test.h | |
parent | eee95c9448a8accc8416b32c55a89d5796cdf35b (diff) | |
download | chrome-ec-f3c88fa1ab60101f32f9117dced3afdc3f4c9393.tar.gz |
stm32: Implement keyscan test infrastructure
Support the keyscan test functionality on stm32.
Note: This is enabled by default so that it continues to build. But it
is unlikely that we will want this in a shipping image. I suggest we add
the facility for a dev build.
Secondly, the stack has to be larger due to a printf (which admittedly I
could just remove). Should we make the stack size conditional on the
CONFIG? Seems a bit ugly, on the other hand we don't want to waste IRAM.
BUG=chrome-os-partner:12179
BRANCH=none
TEST=manual for now:
On snow:
./ectool keyscan 20000 key_sequence.txt
See that the test passes.
Change-Id: Ic441ca0bde1be9589a924374605e2f146d16f423
Signed-off-by: Simon Glass <sjg@chromium.org>
Reviewed-on: https://gerrit.chromium.org/gerrit/35118
Diffstat (limited to 'include/keyboard_test.h')
-rw-r--r-- | include/keyboard_test.h | 42 |
1 files changed, 42 insertions, 0 deletions
diff --git a/include/keyboard_test.h b/include/keyboard_test.h new file mode 100644 index 0000000000..df95d9c081 --- /dev/null +++ b/include/keyboard_test.h @@ -0,0 +1,42 @@ +/* + * Copyright (c) 2012 The Chromium OS Authors. All rights reserved. + * Use of this source code is governed by a BSD-style license that can be + * found in the LICENSE file. + */ + +/* Keyboard scanner test module for Chrome EC */ + +#ifndef __CROS_EC_KEYBOARD_TEST_H +#define __CROS_EC_KEYBOARD_TEST_H + +#include <timer.h> + +/* + * Keyboard scan test item - contains a single scan to 'present' to key scan + * logic. + */ +struct keyscan_item { + timestamp_t abs_time; /* absolute timestamp to present this item */ + uint32_t time_us; /* time for this item relative to test start */ + uint8_t done; /* 1 if we managed to present this */ + uint8_t scan[KB_OUTPUTS]; +}; + +/** + * Get the next key scan from the test sequence, if any + * + * @param column Column to read (-1 to OR all columns together + * @param scan Raw scan data read from GPIOs + * @return test scan, or just 'scan' if no test is active + */ +uint8_t keyscan_seq_get_scan(int column, uint8_t scan); + +/** + * Calculate the delay until the next key scan event needs to be presented + * + * @return number of microseconds from now until the next key scan event, or + * -1 if there is no future key scan event (e.g. testing is complete) + */ +int keyscan_seq_next_event_delay(void); + +#endif |