Add debounce test to kb_deghost and change name to kb_scan

To minimize the number of test binaries, we should put as many tests in
a single binary as possible. This CL merges kb_debouncing and
kb_deghosting and renames them to kb_scan.

BUG=chrome-os-partner:18598
TEST=Run on Spring
BRANCH=None

Change-Id: I876363ba68c692a7af10badfa474a2ea9a9d002c
Signed-off-by: Vic Yang <victoryang@chromium.org>
Reviewed-on: https://gerrit.chromium.org/gerrit/47980

1 files changed, 5 insertions, 9 deletions

diff --git a/test/build.mk b/test/build.mk
index 542178c600..2fcdd3414d 100644
--- a/test/build.mk
+++ b/test/build.mk
@@ -7,18 +7,18 @@
 #
 
 test-list=hello pingpong timer_calib timer_dos timer_jump mutex thermal
-test-list+=power_button kb_deghost kb_debounce scancode typematic charging
+test-list+=power_button kb_scan scancode typematic charging
 test-list+=flash_overwrite flash_rw_erase utils
 #disable: powerdemo
 
-kb_deghost-y=kb_deghost.o
+flash_overwrite-y=flash.o
+flash_rw_erase-y=flash.o
+kb_scan-y=kb_scan.o
+mutex-y=mutex.o
 pingpong-y=pingpong.o
 powerdemo-y=powerdemo.o
 timer_calib-y=timer_calib.o
 timer_dos-y=timer_dos.o
-mutex-y=mutex.o
-flash_overwrite-y=flash.o
-flash_rw_erase-y=flash.o
 utils-y=utils.o
 
 # Mock modules for 'thermal'
@@ -41,10 +41,6 @@ common-mock-scancode-i8042.o=mock_i8042.o
 chip-mock-typematic-keyboard_scan_stub.o=mock_keyboard_scan_stub.o
 common-mock-typematic-i8042.o=mock_i8042.o
 
-# Mock modules for 'kb_debounce'
-chip-mock-kb_debounce-keyboard_scan_stub.o=mock_keyboard_scan_stub.o
-common-mock-kb_debounce-i8042.o=mock_i8042.o
-
 # Mock modules for 'charging'
 chip-mock-charging-gpio.o=mock_gpio.o
 common-mock-charging-x86_power.o=mock_x86_power.o