diff options
| -rw-r--r-- | include/test_util.h | 6 | ||||
| -rw-r--r-- | test/cbi.c | 2 |
2 files changed, 7 insertions, 1 deletions
diff --git a/include/test_util.h b/include/test_util.h index ff2c99d950..a4daaf7f87 100644 --- a/include/test_util.h +++ b/include/test_util.h @@ -359,6 +359,10 @@ int test_attach_i2c(const int port, const uint16_t addr_flags); * This macro uses the lowest common denominator of the two (Zephyr) so tests * that migrate from platform/ec to Zephyr will no longer be able to use the * arguments (compile time checked). + * TEST_SUITE(name) macro is resolved to TEST_MAIN in platform/ec tests. + * In Zephyr tests it allows to use different name for entry point than + * test_main(void). Because of that, it is possible to combine multiple test + * suites in one test. * * Usage: * TEST_MAIN() @@ -368,6 +372,7 @@ int test_attach_i2c(const int port, const uint16_t addr_flags); */ #ifdef CONFIG_ZEPHYR #define TEST_MAIN() void test_main(void) +#define TEST_SUITE(name) void name(void) #else #define TEST_MAIN() \ void test_main(void); \ @@ -378,6 +383,7 @@ int test_attach_i2c(const int port, const uint16_t addr_flags); test_print_result(); \ } \ void test_main(void) +#define TEST_SUITE(name) TEST_MAIN() #endif /* diff --git a/test/cbi.c b/test/cbi.c index 2096ebce5a..222128ce8d 100644 --- a/test/cbi.c +++ b/test/cbi.c @@ -268,7 +268,7 @@ DECLARE_EC_TEST(test_bad_crc) return EC_SUCCESS; } -TEST_MAIN() +TEST_SUITE(test_suite_cbi) { ztest_test_suite(test_cbi, ztest_unit_test_setup_teardown(test_uint8, test_setup, |