diff options
| -rw-r--r-- | zephyr/test/drivers/src/bmi260.c | 72 |
1 files changed, 71 insertions, 1 deletions
diff --git a/zephyr/test/drivers/src/bmi260.c b/zephyr/test/drivers/src/bmi260.c index 9c89245e8c..fb00288367 100644 --- a/zephyr/test/drivers/src/bmi260.c +++ b/zephyr/test/drivers/src/bmi260.c @@ -2104,6 +2104,73 @@ void test_bmi_config_unsupported_chip(void) EC_ERROR_INVALID_CONFIG, ret); } +void test_init_config_read_failure(void) +{ + /* Test proper response to a failed read from the register + * BMI260_INTERNAL_STATUS. + */ + + struct i2c_emul *emul = bmi_emul_get(BMI_ORD); + struct motion_sensor_t *ms_acc = &motion_sensors[BMI_ACC_SENSOR_ID]; + int ret; + + /* Set up i2c emulator and mocks */ + bmi_emul_set_reg(emul, BMI260_CHIP_ID, BMI260_CHIP_ID_MAJOR); + i2c_common_emul_set_read_fail_reg(emul, BMI260_INTERNAL_STATUS); + RESET_FAKE(init_rom_map); + init_rom_map_fake.custom_fake = init_rom_map_addr_passthru; + + ret = ms_acc->drv->init(ms_acc); + + zassert_equal(ret, EC_ERROR_INVALID_CONFIG, "Expected %d but got %d", + EC_ERROR_INVALID_CONFIG, ret); +} + +/* Mock read function and counter used to test the timeout when + * waiting for the chip to initialize + */ +static int timeout_test_status_reg_access_count; +static int status_timeout_mock_read_fn(struct i2c_emul *emul, int reg, + uint8_t *val, int bytes, void *data) +{ + if (reg == BMI260_INTERNAL_STATUS && val) { + /* We want to force-return a non-OK status each time */ + timeout_test_status_reg_access_count++; + *val = BMI260_INIT_ERR; + return 0; + } else { + return 1; + } +} + +void test_init_config_status_timeout(void) +{ + /* We allow up to 15 tries to get a successful BMI260_INIT_OK + * value from the BMI260_INTERNAL_STATUS register. Make sure + * we properly handle the case where the chip is not initialized + * before the timeout. + */ + + struct i2c_emul *emul = bmi_emul_get(BMI_ORD); + struct motion_sensor_t *ms_acc = &motion_sensors[BMI_ACC_SENSOR_ID]; + int ret; + + /* Set up i2c emulator and mocks */ + bmi_emul_set_reg(emul, BMI260_CHIP_ID, BMI260_CHIP_ID_MAJOR); + timeout_test_status_reg_access_count = 0; + i2c_common_emul_set_read_func(emul, status_timeout_mock_read_fn, NULL); + RESET_FAKE(init_rom_map); + init_rom_map_fake.custom_fake = init_rom_map_addr_passthru; + + ret = ms_acc->drv->init(ms_acc); + + zassert_equal(timeout_test_status_reg_access_count, 15, + "Expected %d attempts but counted %d", 15, + timeout_test_status_reg_access_count); + zassert_equal(ret, EC_ERROR_INVALID_CONFIG, "Expected %d but got %d", + EC_ERROR_INVALID_CONFIG, ret); +} + void test_suite_bmi260(void) { ztest_test_suite(bmi260, @@ -2131,6 +2198,9 @@ void test_suite_bmi260(void) ztest_user_unit_test( test_bmi_config_load_no_mapped_flash), ztest_user_unit_test( - test_bmi_config_unsupported_chip)); + test_bmi_config_unsupported_chip), + ztest_user_unit_test( + test_init_config_read_failure), + ztest_user_unit_test(test_init_config_status_timeout)); ztest_run_test_suite(bmi260); } |