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authorSebastian Hesselbarth <sebastian.hesselbarth@gmail.com>2015-04-14 14:23:30 -0700
committerBryan Wu <cooloney@gmail.com>2015-05-04 11:05:54 -0700
commit65c6b7e3ab70effc150dacc9c2fbd6581925dd53 (patch)
treee2babc061bd43fe446f8734024c57134a2511ac0 /drivers/of
parente370d010a5fe385ae65635ce0dbb1eff0e25059c (diff)
downloadlinux-next-65c6b7e3ab70effc150dacc9c2fbd6581925dd53.tar.gz
leds: gpio: Fix device teardown on probe deferral
In gpio_leds_create(), when devm_get_gpiod_from_child() fails with -EPROBE_DEFER on the second gpio led to be created, the first already registered led is not torn down properly. This causes create_gpio_led() to fail for the first led on re-probe(). Fix this misbehaviour by incrementing num_leds only if all potentially failing calls completed successfully. Signed-off-by: Sebastian Hesselbarth <sebastian.hesselbarth@gmail.com> Acked-by: Jacek Anaszewski <j.anaszewski@samsung.com> Signed-off-by: Bryan Wu <cooloney@gmail.com>
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