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| author | Uli Schlachter <psychon@znc.in> | 2013-09-29 13:12:55 +0200 |
|---|---|---|
| committer | Uli Schlachter <psychon@znc.in> | 2013-10-03 16:58:52 +0200 |
| commit | bc89be2fff92968a1b585e75371ae2a8a26592e9 (patch) | |
| tree | 0737ac4f2df184959d6cd802013e849a2c94a5fd /test/device-offset-scale.c | |
| parent | 5e6e4536716197ea0605732d32959c57ea8bb140 (diff) | |
| download | cairo-bc89be2fff92968a1b585e75371ae2a8a26592e9.tar.gz | |
Remove XFAIL_TESTS from Makefile.am
The variable XFAIL_TESTS is not used anymore since commit e90073f7ddc.
The description for the known failures are moved into the respective tests as
comments.
The following descriptions were dropped:
- surface-pattern-big: Didn't really explain the failure
- big-line: Test isn't failing any more
- self-intersecting: Only XFAIL on quartz, but description doesn't match this
The following tests don't have a xfail reference image and seem to fail just
because of not having a reference image at all (I kept their description for
now):
big-trap, long-lines, self-copy-overlap
Signed-off-by: Uli Schlachter <psychon@znc.in>
Diffstat (limited to 'test/device-offset-scale.c')
| -rw-r--r-- | test/device-offset-scale.c | 4 |
1 files changed, 4 insertions, 0 deletions
diff --git a/test/device-offset-scale.c b/test/device-offset-scale.c index 3df3d38f9..33784fa8b 100644 --- a/test/device-offset-scale.c +++ b/test/device-offset-scale.c @@ -65,6 +65,10 @@ draw (cairo_t *cr, int width, int height) return CAIRO_TEST_SUCCESS; } +/* + * XFAIL: complication of pre-multiplying device_offset into the pattern_matrix + * and then requiring further manipulation for SVG + */ CAIRO_TEST (device_offset_scale, "Test that the device-offset transform is transformed by the ctm.", "device-offset", /* keywords */ |