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authorJack Rosenthal <jrosenth@chromium.org>2021-11-04 12:11:58 -0600
committerCommit Bot <commit-bot@chromium.org>2021-11-05 04:22:34 +0000
commit252457d4b21f46889eebad61d4c0a65331919cec (patch)
tree01856c4d31d710b20e85a74c8d7b5836e35c3b98 /test/stress.c
parent08f5a1e6fc2c9467230444ac9b582dcf4d9f0068 (diff)
downloadchrome-ec-stabilize-voshyr-14637.B-ish.tar.gz
In the interest of making long-term branch maintenance incur as little technical debt on us as possible, we should not maintain any files on the branch we are not actually using. This has the added effect of making it extremely clear when merging CLs from the main branch when changes have the possibility to affect us. The follow-on CL adds a convenience script to actually pull updates from the main branch and generate a CL for the update. BUG=b:204206272 BRANCH=ish TEST=make BOARD=arcada_ish && make BOARD=drallion_ish Signed-off-by: Jack Rosenthal <jrosenth@chromium.org> Change-Id: I17e4694c38219b5a0823e0a3e55a28d1348f4b18 Reviewed-on: https://chromium-review.googlesource.com/c/chromiumos/platform/ec/+/3262038 Reviewed-by: Jett Rink <jettrink@chromium.org> Reviewed-by: Tom Hughes <tomhughes@chromium.org>
Diffstat (limited to 'test/stress.c')
-rw-r--r--test/stress.c143
1 files changed, 0 insertions, 143 deletions
diff --git a/test/stress.c b/test/stress.c
deleted file mode 100644
index 91a65197f8..0000000000
--- a/test/stress.c
+++ /dev/null
@@ -1,143 +0,0 @@
-/* Copyright 2013 The Chromium OS Authors. All rights reserved.
- * Use of this source code is governed by a BSD-style license that can be
- * found in the LICENSE file.
- */
-
-/* Peripheral stress tests */
-
-#include "console.h"
-#include "ec_commands.h"
-#include "i2c.h"
-#include "test_util.h"
-#include "timer.h"
-#include "util.h"
-
-#ifdef CONFIG_ADC
-#include "adc.h"
-#endif
-
-static int error_count;
-
-/*****************************************************************************/
-/* Test parameters */
-
-/* I2C test */
-#define I2C_TEST_ITERATION 2000
-
-struct i2c_test_param_t {
- int width; /* 8 or 16 bits */
- int port;
- int addr;
- int offset;
- int data; /* Non-negative represents data to write. -1 to read. */
-} i2c_test_params[];
-
-/* Disable I2C test for boards without test configuration */
-#if defined(BOARD_BDS) || defined(BOARD_AURON)
-#undef CONFIG_I2C
-#endif
-
-/* ADC test */
-#define ADC_TEST_ITERATION 2000
-
-/*****************************************************************************/
-/* Test utilities */
-
-/* period between 500us and 32ms */
-#define RAND_US() (((prng_no_seed() % 64) + 1) * 500)
-
-static int stress(const char *name,
- int (*test_routine)(void),
- const int iteration)
-{
- int i;
-
- for (i = 0; i < iteration; ++i) {
- if (i % 10 == 0) {
- ccprintf("\r%s...%d/%d", name, i, iteration);
- usleep(RAND_US());
- }
- if (test_routine() != EC_SUCCESS)
- return EC_ERROR_UNKNOWN;
- }
-
- ccprintf("\r%s...%d/%d\n", name, iteration, iteration);
- return EC_SUCCESS;
-}
-
-#define RUN_STRESS_TEST(n, r, iter) \
- do { \
- if (stress(n, r, iter) != EC_SUCCESS) { \
- ccputs("Fail\n"); \
- error_count++; \
- } \
- } while (0)
-
-/*****************************************************************************/
-/* Tests */
-#ifdef CONFIG_I2C_CONTROLLER
-static int test_i2c(void)
-{
- int res = EC_ERROR_UNKNOWN;
- int mock_data;
- struct i2c_test_param_t *param;
- param = i2c_test_params + (prng_no_seed() % (sizeof(i2c_test_params) /
- sizeof(struct i2c_test_param_t)));
- if (param->width == 8 && param->data == -1)
- res = i2c_read8(param->port, param->addr,
- param->offset, &mock_data);
- else if (param->width == 8 && param->data >= 0)
- res = i2c_write8(param->port, param->addr,
- param->offset, param->data);
- else if (param->width == 16 && param->data == -1)
- res = i2c_read16(param->port, param->addr,
- param->offset, &mock_data);
- else if (param->width == 16 && param->data >= 0)
- res = i2c_write16(param->port, param->addr,
- param->offset, param->data);
- else if (param->width == 32 && param->data == -1)
- res = i2c_read32(param->port, param->addr,
- param->offset, &mock_data);
- else if (param->width == 32 && param->data >= 0)
- res = i2c_write32(param->port, param->addr,
- param->offset, param->data);
-
- return res;
-}
-#endif
-
-#ifdef CONFIG_ADC
-__attribute__((weak)) int adc_read_all_channels(int *data)
-{
- int i;
- int rv = EC_SUCCESS;
-
- for (i = 0; i < ADC_CH_COUNT; ++i) {
- data[i] = adc_read_channel(i);
- if (data[i] == ADC_READ_ERROR)
- rv = EC_ERROR_UNKNOWN;
- }
-
- return rv;
-}
-
-static int test_adc(void)
-{
- int data[ADC_CH_COUNT];
- return adc_read_all_channels(data);
-}
-#endif
-
-void run_test(int argc, char **argv)
-{
- test_reset();
-
-#ifdef CONFIG_I2C_CONTROLLER
- RUN_STRESS_TEST("I2C Stress Test", test_i2c, I2C_TEST_ITERATION);
-#endif
-#ifdef CONFIG_ADC
- RUN_STRESS_TEST("ADC Stress Test", test_adc, ADC_TEST_ITERATION);
-#endif
-
- test_print_result();
-}