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The variable XFAIL_TESTS is not used anymore since commit e90073f7ddc.
The description for the known failures are moved into the respective tests as
comments.
The following descriptions were dropped:
- surface-pattern-big: Didn't really explain the failure
- big-line: Test isn't failing any more
- self-intersecting: Only XFAIL on quartz, but description doesn't match this
The following tests don't have a xfail reference image and seem to fail just
because of not having a reference image at all (I kept their description for
now):
big-trap, long-lines, self-copy-overlap
Signed-off-by: Uli Schlachter <psychon@znc.in>
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Instead of tagging the sources, which is insensitive to changes, track the
known failure modes by recording the current fail as an xfail.png
reference. (We also introduce a new.png to track a fresh error, so that
they are not lost in the noise of the old XFAILs and hopefully do not
cause everyone to fret).
As we have removed the XFAIL tagging we find, surprise surprise, that some
tests are now working -- so review all the reference images (as also some
.ref.png now should be .xfail.png).
Note: I've only checked image,pdf,ps,svg. The test surfaces report some
failures that probably need to addressed in source. I've not correct the
changes for win32 and quartz. Nor fixed up the experimental backends.
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Avoid calling libtool to link every single test case, by building just one
binary from all the sources.
This binary is then given the task of choosing tests to run (based on user
selection and individual test requirement), forking each test into its own
process and accumulating the results.
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Use cairo_get_target() to propagate errors from the secondary contexts.
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It's sad to have to do this. Back with commit 1a9809baa was the
original fix for device-offset-scale, (right after the test was
added), and it fixed it for all backends, including SVG. The fix
involved combining device_transform and CTM into the pattern matrix.
But then, we added the mask-transformed-image and
mask-transformed-similar tests, and commit 20be3182ef29 for fixing an
SVG-specific bug with masks. That fix involved subtracting away the
pattern matrix when emitting a mask to adhere to SVG semantics.
Unfortunately, this change also made the device-offset-scale test
start failing. A correct fix would probably subtract away only the CTM
portion and not the devive_transform. However, the
_cairo_svg_surface_mask function sees only a pattern matrix and
doesn't know how to separate it into CTM and device_transform pieces.
So fixing this will probably require a change to the surface-backend
interface. And since we're not willing to do that so close to a major
release, we're adding yet another XFAIL.
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In order to run under memfault, the framework is first extended to handle
running concurrent tests - i.e. multi-threading. (Not that this is a
requirement for memfault, instead it shares a common goal of storing
per-test data). To that end all the global data is moved into a per-test
context and the targets are adjusted to avoid overlap on shared, global
resources (such as output files and frame buffers). In order to preserve
the simplicity of the standard draw routines, the context is not passed
explicitly as a parameter to the routines, but is instead attached to the
cairo_t via the user_data.
For the masochist, to enable the tests to be run across multiple threads
simply set the environment variable CAIRO_TEST_NUM_THREADS to the desired
number.
In the long run, we can hope the need for memfault (runtime testing of
error paths) will be mitigated by static analysis. A promising candidate
for this task would appear to be http://hal.cs.berkeley.edu/cil/.
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